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- Article name
- METHODS OF MEASURING THE CURRENT IN MODERN MICROELECTRONICS
- Authors
- Miskov D. V., , dv41@mail.ru, Moscow State Institute of Radio-Еngineering Electronics and Automation (Technical University), Moscow, Russia
Salakhov R. F., , rf.salahoff@yandex.ru, Podolsk Institute, branch of the Moscow State Machine-building University, Podolsk, Moscow region, Russia
- Keywords
- current / measurement / Hall effect / ADC
- Year
- 2015 Issue 3 Pages 59 - 62
- Code EDN
- Code DOI
- Abstract
- The article describes the basic methods of measurement of current in the circuit in modern microelectronics. Held multi-criteria analysis of each method and concluded that the convenience of its use in microprocessor systems.
- Text
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