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- Article name
- Statistical analysis of the distribution of charge minority carriers generated by electromagnetic radiation in a semiconductor material
- Authors
- Seregina E. V., , rector@kspu.kaluga.ru, Kaluga State University, 26 Stepan Razin str., Kaluga, 248023, Russia
Stepovich M. A., , rector@kspu.kaluga.ru, Kaluga State University, 26 Stepan Razin str., Kaluga, 248023, Russia
Makarenkov A. M., , mail@bmstu-kaluga.ru, Kaluga Branch of Bauman Moscow State Technical University, 2 Bazhenov str., Kaluga, 248600, Russia
- Keywords
- semiconductors / electrophysical parameters / projective method / an assessment of distribution of minority carriers of a charge
- Year
- 2012 Issue 3 Pages 24 - 31
- Code EDN
- Code DOI
- Abstract
- The projective method has been used for a statistical analysis of the distribution of charge minority carriers generated by electromagnetic radiation in a semiconductor material.
- Text
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