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- Article name
- Improving quality factor of the vibrational system of an atomic force microscope
- Authors
- Vasin V. A., , vacuumwa@list.ru, Moscow State Institute of Electronics and Mathematics, 3 B. Trekhsvyatitelsky Lane, Moscow, 109028, Russia
Fatjanova N. G., , vacuumwa@list.ru, Moscow State Institute of Electronics and Mathematics, 3 B. Trekhsvyatitelsky Lane, Moscow, 109028, Russia
Stepanchikov S. V., , ienmiem@mail.ru, Moscow State Institute of Electronics and Mathematics (Technical University), Russia
Vasichev B. N., , vasichev@yandex.ru, Moscow State Institute of Electronics and Mathematics, 3 Bolshoy Trekhsvyatitelsky al., Moscow, 109028, Russia
- Keywords
- phase contrast / Q factor / atomic force microscope / miniature vacuum pumping system / controlled vacuum medium
- Year
- 2012 Issue 3 Pages 106 - 110
- Code EDN
- Code DOI
- Abstract
- The reasons of the low-phase-contrast images with an atomic force microscope in the study of the surface are investigated. Ways have been obtained to improve the phase-contrast images with an atomic force microscope. Considered are the fundamentally new approaches to designing an atomic force microscope with a miniature vacuum system that provides conditions for the improvement of the phase contrast image.
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