
PRIKLADNAYA FIZIKA
(APPLIED PHYSICS)
THE SCIENTIFIC AND TECHNICAL JOURNAL
No. 6 Founded in 1994 Moscow 2014
C O N T E N T S
GENERAL PHYSICS
V. M. Kotov Acousto-optic modulation of multi-color radiation with the proportional changing of the light waves intensity |
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5 |
M. B. Grisheckin, I. А. Denisov, А. А. Silina, N. А. Smirnova, N. I. Shmatov, and А. G. Yakovenko Investigation of structural defects in CdZnTe crystals by the infrared and optical microscopy |
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9 |
A. V. Romanov, M. A. Stepovich, and M. N. Filippov Using the model for the generation of secondary fluorescence spectra of condensed matter |
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16 |
N. A. Mammadov, G. I. Garibov, Sh. Sh. Alekberov, and E. A. Rasulov Influence of various external factors on the water surface tension | 20 |
PLASMA PHYSICS AND PLASMA METHODS
V. V. Andreev Study of impact of dielectric barrier discharge on the silicon-containing film |
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24 |
V. I. Asiunin, S. G. Davydov, A. N. Dolgov, T. I. Kozlovskaya, A. A. Pshenichniy, and R. Kh. Yakubov Arc discharge plasma dynamic features in inhomogeneous magnetic field | 29 | |
S. G. Davydov, A. N. Dolgov, T. I. Kozlovskaya, V. O. Revazov, V. P. Seleznev, and R. Kh. Yakubov The commutation process of a vacuum electrical gap in laser plasma | 32 | |
V. A. Ivanov, M. E. Konyzhev, A. A. Dorofeyuk, T. I. Kamolova, L. I. Kuksenova, V. G. Lapteva, and I. A. Khrennikova Formation of a strong microrelief on the steel–45 surface by microplasma discharges | 38 |
PHOTOELECTRONICS
N. D. Il’inskaya, S. A. Karandashev, N. G. Karpukhina, A. A. Lavrov, B. A. Matveev, M. A. Remennyi, N. M. Stus’, and A. A. Usikova The 3х3 matrix based on p-InAsSbP/n-InAs single heterostructure diodes |
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47 |
I. A. Nikiforov, A. V. Nikonov, K. O. Boltar, and N. I. Iakovleva Temperature dependence of minority carriers diffusion length in MCT |
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52 |
A. A. Lopukhin, V. E. Stepanyuk, I. I. Taubkin, and V. V. Fadeev Research of infrared light annealing influence on properties the InSb FPA’s structures |
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56 |
E. D. Korotaev, N. I. Iakovleva, A. E. Mirifianchenko, and A. V. Lialikov Main features of InGaAs/InP heterostructures intended for SWIR highspeed operation applications |
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60 |
A. A. Lopuhin Influence of the photosensitive layer thickness on InSb FPA properties |
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66 |
A. L. Sizov, A. E. Mirifianchenko, A. V. Lialikov, and N. I. Iakovleva Сrystallographic analysis of the CdHgTe heteroepitaxial structures |
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70 |
A. Sh. Abdinov, N. М. Mehtiyev, R. F. Babayeva, and R. M. Rzayev Multifunctional photodetectors based on the n-InSe crystals | 76 |
PHYSICAL APPARATUS AND ITS ELEMENTS
V. V. Aleksandrov, Y. S. Bychkouski, B. N. Drazhnikov, K. V. Kozlov, I. S. Kondyushin, and A. V. Matveev Universal equipment for measuring the electrical parameters of different electronic devices |
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81 |
A. D. Deomidov, M. E. Kononov, A. V. Polesskiy, N. A. Semenchenko, K. A. Khamidullin, and S. V. Dobrunov Test equipment for spectral response measurement of ultraviolet focal plane arrays | 87 | |
D. L. Baliev, E. A. Bedareva, A. D. Deomidov, A. V. Polesskiy, A. V. Sidorin, K. A. Khamidullin, A. D. Yudovskaya, and G. M. Tsygankova The automatic test-bench for measurement of the FPA characteristics based on InGaAs | 93 |
INFORMATION
Memory of Academician Yu. K. Pojela | 99 | |
Rules for authors |
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100 |
Subscription | 102 |