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- Article name
- RESEARCH OF MICROSTRUCTURE AND ELEMENTAL COMPOSITION PLATINITA METHODS REM AND SPM
- Authors
- Nishchev K. N., , nishchev@inbox.ru, National Research Mordovia State University, Saransk, Russia
Mishkin V. P., , vladimirm1978@mail.ru, National Research Mordovia State University, Saransk, Russia
Vilkova M. V., , mariya.vilkova@gmail.com, National Research Mordovia State University, Saransk, Russia
Ilyushkin V. Yu., , ilyushkin092009@rambler.ru, National Research Mordovia State University, Saransk, Russia
Rozhaev D. I., , mr_chester@mail.ru, National Research Mordovia State University, Saransk, Russia
- Keywords
- composite materials / platinite / microstructure / elemental composition / scanning electronic microscopy / the focused ion beam / scanning probe microscopy
- Year
- 2014 Issue 1 Pages 43 - 48
- Code EDN
- Code DOI
- Abstract
- Microstructure and element structure of oxidized platinite wire samples used for manufacturing of electric leads in production of electronic and electrovacuum devices were investigated using Quanta 200i 3D FEI scanning electron microscope (SEM) and Shimadzu SPM 9600 scanning probe microscope (SPM). Optimum techniques of SEM and SPM for determination of platinite copper cover thickness, as well as thickness and microstructure of copper (I) oxide coating are determined. It is shown that when using SEM for platinite microstructure identification it is optimal to apply the Back-Scattered Electrons Detector (BSED), and focused ionic beam (FIB) and ion optics of Quanta 200i 3D FEI for determination of thickness and microstructure of a superficial oxide layer.
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