To obtain access to full text of journal and articles you must register!
- Article name
- Changes in low-frequency noise's level depending on the thermal and electric loadings
- Authors
- KHOLKIN V. U., , vkholkin@mail.ru, North-West State Technical University by Correspondence, Saint-Petersburg, Russia
- Keywords
- low-frequency nois / nois potential / abnormalitys semiconductor devices / semiconductor devices / destabilize factor / temperature dependence / alternation noise
- Year
- 2009 Issue 2 Pages 81 - 85
- Code EDN
- Code DOI
- Abstract
- The results of research in the question of behavior of low-frequency noise's level at the change of the thermal and electric loadings are represented. Silicic diodes KD209 were used as the object of research.
- Text
- To obtain access to full text of journal and articles you must register!
- Buy